By Jaiswal, Ravi; Mittal, K. L

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Extra resources for Particle adhesion and removal

Example text

In the SS method, the dielectric response function, (i ) , is represented by a model based on a damped oscillator [77, 119, 120, 125, 127]. 86) UV where CIR and CUV are the absorption strengths in the IR and UV range and ωIR and ωUV represent the characteristic absorption frequencies in the IR and UV range. CIR and CUV are parameters used to fit physical property 42 Particle Adhesion and Removal data such as ξ and ε(iξ). CUV and ωUV can also be determined from Cauchy plots of refractive index and frequency.

Ease of comparison, the total force is normalized by the particle radius. The relevant region of RH to be considered in this figure is the region with RH > 50%, as this is the condition where condensed moisture can be wellrepresented as continuum. In this region, it can be seen that the surface tension force (inverted triangles) makes a negligible contribution to the overall force (solid lines) when the particle size is above 1000 nm. When the particle radius is 100 nm, the surface tension force contribution to the overall force is no longer negligible, and when the particle is nano-scale and the RH is high, the surface tension force and the capillary pressure force make comparable contributions to the overall force.

30 can be neglected. 31. 3 Non-spherical Particles Against a Flat Surface Particle shape can influence the capillary forces by changing the geometrical parameters of the liquid meniscus generated at the solid/solid interface in a humid environment. 13 (bottom) shows predicted capillary forces, based on the Kelvin-Laplace equation, between a flat substrate and these AFM probes [40]. As noted above, the RH levels at which the Kelvin-Laplace equation may be applied are strictly limited by the ability of the two surfaces to approach each other.